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  Trends and developments in scanning near-field optical microscopy

Sandoghdar, V. (2001). Trends and developments in scanning near-field optical microscopy. In NANOMETER SCALE SCIENCE AND TECHNOLOGY (pp. 65-119). NIEUWE HEMWEG 6B, 1013 BG AMSTERDAM, NETHERLANDS: I O S PRESS.

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Item Permalink: https://hdl.handle.net/21.11116/0000-0002-9BCF-7 Version Permalink: https://hdl.handle.net/21.11116/0000-0007-95BC-D
Genre: Conference Paper

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Sandoghdar, Vahid1, Author           
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1External Organizations, ou_persistent22              

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Language(s): eng - English
 Dates: 2001
 Publication Status: Issued
 Pages: -
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Title: International-School-of-Physics-Enrico-Fermi on Nanometer Scale Science and Technology
Place of Event: VARENNA, ITALY
Start-/End Date: 2000-06-27 - 2000-07-07

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Title: NANOMETER SCALE SCIENCE AND TECHNOLOGY
Source Genre: Proceedings
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Publ. Info: NIEUWE HEMWEG 6B, 1013 BG AMSTERDAM, NETHERLANDS : I O S PRESS
Pages: - Volume / Issue: - Sequence Number: - Start / End Page: 65 - 119 Identifier: ISBN: 1-58603-165-1

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Title: Proceedings of the International School of Physics Enrico Fermi
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Pages: - Volume / Issue: 144 Sequence Number: - Start / End Page: - Identifier: -