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  High-contrast topography-free sample for near-field optical microscopy

Kalkbrenner, T., Graf, M., Durkan, C., Mlynek, J., & Sandoghdar, V. (2000). High-contrast topography-free sample for near-field optical microscopy. Applied Physics Letters, 76, 1206-1208. doi:10.1063/1.125984.

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Item Permalink: https://hdl.handle.net/21.11116/0000-0002-9BD5-F Version Permalink: https://hdl.handle.net/21.11116/0000-0007-95C8-F
Genre: Journal Article

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 Creators:
Kalkbrenner, Thomas1, Author
Graf, M1, Author
Durkan, C1, Author
Mlynek, Jürgen1, Author
Sandoghdar, Vahid2, Author           
Affiliations:
1external, ou_persistent22              
2External Organizations, ou_persistent22              

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 Abstract: The issue of topography artifacts has proven to play a very important role in interpreting images recorded in scanning near-field optical microscopy. We report on the fabrication and characterization of samples with essentially no topographic features while possessing very high optical contrast on the nanometric lateral scale. These samples open the door to routine and uncontroversial examinations of the resolution obtained in a scanning near-field optical microscope. (C) 2000 American Institute of Physics. [S0003-6951(00)04409-0].

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Language(s): eng - English
 Dates: 2000
 Publication Status: Issued
 Pages: -
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 Table of Contents: -
 Rev. Type: -
 Identifiers: DOI: 10.1063/1.125984
 Degree: -

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Title: Applied Physics Letters
  Abbreviation : Appl. Phys. Lett.
Source Genre: Journal
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Publ. Info: Melville, NY : American Institute of Physics
Pages: - Volume / Issue: 76 Sequence Number: - Start / End Page: 1206 - 1208 Identifier: ISSN: 0003-6951
CoNE: https://pure.mpg.de/cone/journals/resource/954922836223