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  Reflection scanning near-field optical microscopy with uncoated fiber tips: How good is the resolution really?

Sandoghdar, V., Wegscheider, S., Krausch, G., & Mlynek, J. (1997). Reflection scanning near-field optical microscopy with uncoated fiber tips: How good is the resolution really? Journal of Applied Physics, 81, 2499-2503. doi:10.1063/1.363957.

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Sandoghdar, Vahid1, Author              
Wegscheider, S2, Author
Krausch, G2, Author
Mlynek, Jürgen2, Author
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1External Organizations, ou_persistent22              
2external, ou_persistent22              

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 Abstract: We have investigated the optical resolution of a scanning near-field optical microscope in reflection collection mode using an uncoated fiber tip. We demonstrate that the apparent resolution in the optical signal (better than 70 nm) is a topography-induced effect. We believe that the purely optical resolution is only of the order of lambda/2 and diffraction limited. (C) 1997 American Institute of Physics.

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Language(s): eng - English
 Dates: 1997
 Publication Status: Published in print
 Pages: -
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 Table of Contents: -
 Rev. Type: -
 Identifiers: DOI: 10.1063/1.363957
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Title: Journal of Applied Physics
  Abbreviation : J. Appl. Phys.
Source Genre: Journal
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Publ. Info: New York, NY : AIP Publishing
Pages: - Volume / Issue: 81 Sequence Number: - Start / End Page: 2499 - 2503 Identifier: ISSN: 0021-8979
CoNE: https://pure.mpg.de/cone/journals/resource/991042723401880