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  Scanning probe microscopy for energy-related materials

Berger, R., Grevin, B., Leclere, P., & Zhang, Y. (2019). Scanning probe microscopy for energy-related materials. Beilstein Journal of Nanotechnology, 10: 134. 132. doi:10.3762/bjnano.10.12.

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Item Permalink: http://hdl.handle.net/21.11116/0000-0002-D246-2 Version Permalink: http://hdl.handle.net/21.11116/0000-0002-D24C-C
Genre: Journal Article

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 Creators:
Berger, Rüdiger1, Author              
Grevin, Benjamin2, Author
Leclere, Philippe3, Author
Zhang, Yi4, Author
Affiliations:
1Dept. Butt: Physics at Interfaces, MPI for Polymer Research, Max Planck Society, ou_1800286              
2CEA Grenoble INAC SYMMES, UMR5819 CEA CNRS UGA, Grenoble, France, ou_persistent22              
3Univ Mons UMONS, CIRMAP, Mons, Belgium, ou_persistent22              
4Chinese Acad Sci, Shanghai Inst Appl Phys, Shanghai, Peoples R China, ou_persistent22              

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Language(s): eng - English
 Dates: 2019
 Publication Status: Published online
 Pages: -
 Publishing info: -
 Table of Contents: -
 Rev. Type: -
 Identifiers: DOI: 10.3762/bjnano.10.12
 Degree: -

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Title: Beilstein Journal of Nanotechnology
  Abbreviation : Beilstein J. Nanotechnol.
Source Genre: Journal
 Creator(s):
Affiliations:
Publ. Info: Frankfurt am Main : Beilstein-Institut
Pages: - Volume / Issue: 10 Sequence Number: 134 Start / End Page: - 132 Identifier: ISSN: 2190-4286
CoNE: https://pure.mpg.de/cone/journals/resource/2190-4286