Scanning probe microscopy for energy-related materials

Berger, Rüdiger; Grevin, Benjamin; Leclere, Philippe; Zhang, Yi

doi:10.3762/bjnano.10.12

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Scanning probe microscopy for energy-related materials

Berger, R., Grevin, B., Leclere, P., & Zhang, Y. (2019). Scanning probe microscopy for energy-related materials. Beilstein Journal of Nanotechnology, 10: 134. 132. doi:10.3762/bjnano.10.12.

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Item Permalink: https://hdl.handle.net/21.11116/0000-0002-D246-2 Version Permalink: https://hdl.handle.net/21.11116/0000-0002-D24C-C

Genre: Journal Article

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Creators:
Berger, Rüdiger¹, Author
Grevin, Benjamin², Author
Leclere, Philippe³, Author
Zhang, Yi⁴, Author

Affiliations:
1Dept. Butt: Physics at Interfaces, MPI for Polymer Research, Max Planck Society, ou_1800286
2CEA Grenoble INAC SYMMES, UMR5819 CEA CNRS UGA, Grenoble, France, ou_persistent22
3Univ Mons UMONS, CIRMAP, Mons, Belgium, ou_persistent22
4Chinese Acad Sci, Shanghai Inst Appl Phys, Shanghai, Peoples R China, ou_persistent22

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Language(s): eng - English

Dates: Published Online: 2019

Publication Status: Published online

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Identifiers: DOI: 10.3762/bjnano.10.12

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Title: Beilstein Journal of Nanotechnology

Abbreviation : Beilstein J. Nanotechnol.

Source Genre: Journal

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Publ. Info: Frankfurt am Main : Beilstein-Institut

Pages: - Volume / Issue: 10 Sequence Number: 134 Start / End Page: - 132 Identifier: ISSN: 2190-4286
CoNE: https://pure.mpg.de/cone/journals/resource/2190-4286