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  The effect of Coulomb repulsion on the space-time resolution limits for ultrafast electron diffraction

Ischenko, A. A., Kochikov, I. V., & Miller, R. J. D. (2019). The effect of Coulomb repulsion on the space-time resolution limits for ultrafast electron diffraction. The Journal of Chemical Physics, 150(5): 054201. doi:10.1063/1.5060673.

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Item Permalink: http://hdl.handle.net/21.11116/0000-0003-092B-4 Version Permalink: http://hdl.handle.net/21.11116/0000-0003-092C-3
Genre: Journal Article

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https://dx.doi.org/10.1063/1.5060673 (Publisher version)
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 Creators:
Ischenko, A. A.1, Author
Kochikov, I. V.2, Author
Miller, R. J. D.3, 4, 5, Author              
Affiliations:
1Institute of Fine Chemical Technologies named after M.V. Lomonosov, Russian Technological University—MIREA, ou_persistent22              
2Research Computing Center, Lomonosov Moscow State University, ou_persistent22              
3Miller Group, Atomically Resolved Dynamics Department, Max Planck Institute for the Structure and Dynamics of Matter, Max Planck Society, ou_1938288              
4Center for Ultrafast Imaging, ou_persistent22              
5Departments of Chemistry and Physics, University of Toronto, ou_persistent22              

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 Abstract: The development of electron sources capable of temporal resolution on the order of 1 ps or less raises a number of questions associated with the estimation of the physical meaning and accuracy of the dynamic parameters based on the analysis of time-dependent scattering intensity. The use of low brightness ultrashort pulses with few electrons leads to the necessity for increasing the total exposure time and lengthening the time of data acquisition, with attendant problems with the limited sample. The sample restrictions can be mitigated by increasing the charge per pulse, i.e., by going to high brightness sources. Increasing in the number of electrons, however, is limited by the Coulomb repulsion between them, which leads on one hand to distortion of the diffraction pattern and on the other hand to an increase in the duration of the pulse. An analytical technique for estimating the deformation of the diffraction pattern caused by the Coulomb repulsion of the electrons in electron bunches with duration of less than 10 ps and the influence of this effect on the accuracy of determination of the interatomic distances is developed for the non-relativistic and relativistic regimes for electron energies.

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Language(s): eng - English
 Dates: 2018-09-212018-12-192019-02-072019-02-07
 Publication Status: Published in print
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 Rev. Method: Peer
 Identifiers: DOI: 10.1063/1.5060673
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Title: The Journal of Chemical Physics
  Other : J. Chem. Phys.
Source Genre: Journal
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Publ. Info: Woodbury, N.Y. : American Institute of Physics
Pages: - Volume / Issue: 150 (5) Sequence Number: 054201 Start / End Page: - Identifier: ISSN: 0021-9606
CoNE: https://pure.mpg.de/cone/journals/resource/954922836226