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  Analysis of Fibrous Assembly Orientations from XFEL Diffraction Data

Wojtas, D. H., Seuring, C., Ayyer, K., Arnal, R. D., Meents, A., Mossou, E., et al. (2018). Analysis of Fibrous Assembly Orientations from XFEL Diffraction Data. In 2018 International Conference on Image and Vision Computing New Zealand (IVCNZ). New York, NY 10017 USA: IEEE. doi:10.1109/IVCNZ.2018.8634714.

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Item Permalink: http://hdl.handle.net/21.11116/0000-0003-445E-8 Version Permalink: http://hdl.handle.net/21.11116/0000-0003-446F-5
Genre: Conference Paper

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08634714.pdf (Publisher version), 3MB
 
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https://dx.doi.org/10.1109/IVCNZ.2018.8634714 (Publisher version)
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 Creators:
Wojtas, D. H.1, Author
Seuring, C.2, 3, Author
Ayyer, K.2, Author
Arnal, R. D.1, Author
Meents, A.2, Author
Mossou, E.4, 5, Author
̃Peña, G.2, Author
Paulraj, L. X.2, 6, Author              
Barthelmess, M.2, Author
Forsyth, V. T.4, 5, Author
Barty, A.2, Author
Chapman, H. N.2, 3, 7, Author
Millane, R. P.1, Author
Affiliations:
1Computational Imaging Group, Department of Electrical and Computer Engineering University of Canterbury, ou_persistent22              
2Center for Free-Electron Laser Science, Deutsches Elektronen-Synchrotron (DESY), ou_persistent22              
3The Hamburg Centre for Ultrafast Imaging, ou_persistent22              
4Institut Laue-Langevin, Grenoble, ou_persistent22              
5Faculty of Natural Sciences, Keele University, ou_persistent22              
6International Max Planck Research School for Ultrafast Imaging & Structural Dynamics (IMPRS-UFAST), Max Planck Institute for the Structure and Dynamics of Matter, Max Planck Society, ou_2266714              
7Max-Planck Institute for the Structure and Dynamics of Matter, ou_persistent22              

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Free keywords: X-ray diffraction, XFEL, crystallography, fi-brous assembly, imaging, biological system
 Abstract: The application of a new generation of x-ray sources called X-ray Free Electron Lasers (XFELs) to diffractive imaging has allowed structural studies of specimens not previously accessible. Specimens of reduced crystallinity are of particular interest, including fibrous nano-crystals and single fibrous molecules. Diffractive imaging experiments using XFELs generate large datasets of diffraction frames from specimens with random, unknown orientations. The orientation of each diffraction frame needs to be determined from features in the pattern in order to register and merge the dataset for subsequent structural analysis. Certain sample delivery techniques simplify this process by limiting the range of orientations a specimen may take. In this paper we consider two sample delivery techniques: a liquid jet and a fixed target on a silicon wafer. Orientations determined from diffraction patterns from each delivery method are classified in order to investigate the type of orientation present. This information also helps to characterize the quality of sample preparations and provides feedback valuable for designing future experiments.

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Language(s): eng - English
 Dates: 20182018
 Publication Status: Published in print
 Pages: 6
 Publishing info: -
 Table of Contents: -
 Rev. Method: Internal
 Identifiers: DOI: 10.1109/IVCNZ.2018.8634714
 Degree: -

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Title: International Conference on Image and Vision Computing New Zealand (IVCNZ)
Place of Event: Auckland, New Zealand
Start-/End Date: 2018-11-19 - 2018-11-21

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Title: 2018 International Conference on Image and Vision Computing New Zealand (IVCNZ)
Source Genre: Proceedings
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Publ. Info: New York, NY 10017 USA : IEEE
Pages: - Volume / Issue: - Sequence Number: - Start / End Page: - Identifier: Other: INSPEC Accession Number: 18434764