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  An Automated Computational Approach for Complete In-Plane Compositional Interface Analysis by Atom Probe Tomography

Peng, Z., Lu, Y., Hatzoglou, C., Kwiatkowski da Silva, A., Vurpillot, F., Ponge, D., et al. (2019). An Automated Computational Approach for Complete In-Plane Compositional Interface Analysis by Atom Probe Tomography. Microscopy and Microanalysis, 25(2), 389-400. doi:10.1017/S1431927618016112.

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 Creators:
Peng, Zirong1, Author              
Lu, Yifeng2, Author              
Hatzoglou, Constantinos3, Author              
Kwiatkowski da Silva, Alisson1, Author              
Vurpillot, François4, Author              
Ponge, Dirk5, Author              
Raabe, Dierk1, Author              
Gault, Baptiste6, Author              
Affiliations:
1Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863381              
2Institute for Informatics, Ludwig-Maximilians-Universität München, OettingenStr. 67, 80538 Munich, Germany, ou_persistent22              
3Normandie Univ, UNIROUEN, INSA Rouen, CNRS, GPM, 76000 Rouen, France, ou_persistent22              
4Normandie Université, UNIROUEN, INSA Rouen, CNRS, Groupe de Physique des Matériaux, 76000, Rouen, France, ou_persistent22              
5Mechanism-based Alloy Design, Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863383              
6Atom Probe Tomography, Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863384              

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 Abstract: We introduce an efficient, automated computational approach for analyzing interfaces within atom probe tomography datasets, enabling quantitative mapping of their thickness, composition, as well as the Gibbsian interfacial excess of each solute. Detailed evaluation of an experimental dataset indicates that compared with the composition map, the interfacial excess map is more robust and exhibits a relatively higher resolution to reveal compositional variations. By field evaporation simulations with a predefined emitter mimicking the experimental dataset, the impact of trajectory aberrations on the measurement of the thickness, composition, and interfacial excess of the decorated interface are systematically analyzed and discussed. © Microscopy Society of America 2019.

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Language(s): eng - English
 Dates: 2019-02-062019
 Publication Status: Published in print
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 Table of Contents: -
 Rev. Type: -
 Identifiers: DOI: 10.1017/S1431927618016112
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Title: Microscopy and Microanalysis
  Abbreviation : Microsc. Microanal.
Source Genre: Journal
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Publ. Info: New York, NY : Cambridge University Press
Pages: - Volume / Issue: 25 (2) Sequence Number: - Start / End Page: 389 - 400 Identifier: ISSN: 1431-9276
CoNE: https://pure.mpg.de/cone/journals/resource/991042731793414