English
 
Help Privacy Policy Disclaimer
  Advanced SearchBrowse

Item

ITEM ACTIONSEXPORT
Add to Basket
 Local TagsRelease HistoryDetailsSummary
  An Automated Computational Approach for Complete In-Plane Compositional Interface Analysis by Atom Probe Tomography

Peng, Z., Lu, Y., Hatzoglou, C., Kwiatkowski da Silva, A., Vurpillot, F., Ponge, D., et al. (2019). An Automated Computational Approach for Complete In-Plane Compositional Interface Analysis by Atom Probe Tomography. Microscopy and Microanalysis, 25(2), 389-400. doi:10.1017/S1431927618016112.

Item is

 

show all hide all

Basic

show hide
Item Permalink: https://hdl.handle.net/21.11116/0000-0004-6530-4 Version Permalink: https://hdl.handle.net/21.11116/0000-0004-6532-2
Genre: Journal Article

Files

show Files

Locators

show

Creators

show
hide
 Creators:
Peng, Zirong1, Author           
Lu, Yifeng2, Author           
Hatzoglou, Constantinos3, Author           
Kwiatkowski da Silva, Alisson1, Author           
Vurpillot, François3, Author           
Ponge, Dirk1, Author           
Raabe, Dierk1, Author           
Gault, Baptiste1, Author           
Affiliations:
1Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863381              
2Institute for Informatics, Ludwig-Maximilians-Universität München, OettingenStr. 67, 80538 Munich, Germany, ou_persistent22              
3Normandie Univ, UNIROUEN, INSA Rouen, CNRS, GPM, 76000 Rouen, France, ou_persistent22              

Content

show

Details

show
hide
Language(s):
 Dates: 2019
 Publication Status: Issued
 Pages: -
 Publishing info: -
 Table of Contents: -
 Rev. Type: -
 Identifiers: DOI: 10.1017/S1431927618016112
 Degree: -

Event

show

Legal Case

show

Project information

show

Source 1

show
hide
Title: Microscopy and Microanalysis
Source Genre: Journal
 Creator(s):
Affiliations:
Publ. Info: -
Pages: - Volume / Issue: 25 (2) Sequence Number: - Start / End Page: 389 - 400 Identifier: -