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  Implantation into fullerites

Misof, K., Vogl, G., Fratzl, P., Sielemann, R., Keck, B., & Yoshida, Y. (1993). Implantation into fullerites. In Springer Series in Solid-State Sciences (pp. 44-47). Berlin: Springer.

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Item Permalink: http://hdl.handle.net/21.11116/0000-0003-9291-3 Version Permalink: http://hdl.handle.net/21.11116/0000-0003-FBF5-E
Genre: Book Chapter

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 Creators:
Misof, K., Author
Vogl, G., Author
Fratzl, Peter1, Author              
Sielemann, R., Author
Keck, B., Author
Yoshida, Y., Author
Affiliations:
1External Organizations, ou_persistent22              

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 Dates: 1993
 Publication Status: Published in print
 Pages: -
 Publishing info: -
 Table of Contents: -
 Rev. Method: -
 Identifiers: DOI: 10.1007/978-3-642-85049-3_5
PMID: 0040
 Degree: -

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Title: Springer Series in Solid-State Sciences
Source Genre: Series
 Creator(s):
Affiliations:
Publ. Info: Berlin : Springer
Pages: - Volume / Issue: 117 Sequence Number: - Start / End Page: 44 - 47 Identifier: -

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Title: Electronic Properties of Fullerenes
Source Genre: Book
 Creator(s):
Kuzmany, Hans, Editor
Fink, Jörg, Editor
Mehring, Michael, Author
Roth, Siegmar, Author
Affiliations:
-
Publ. Info: -
Pages: - Volume / Issue: - Sequence Number: - Start / End Page: - Identifier: ISBN: 978-3-642-85051-6