Implantation into fullerites

Misof, K.; Vogl, G.; Fratzl, Peter; Sielemann, R.; Keck, B.; Yoshida, Y.

doi:10.1007/978-3-642-85049-3_5

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Implantation into fullerites

Misof, K., Vogl, G., Fratzl, P., Sielemann, R., Keck, B., & Yoshida, Y. (1993). Implantation into fullerites. In Springer Series in Solid-State Sciences (pp. 44-47). Berlin: Springer.

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Item Permalink: https://hdl.handle.net/21.11116/0000-0003-9291-3 Version Permalink: https://hdl.handle.net/21.11116/0000-0003-FBF5-E

Genre: Book Chapter

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Creators:
Misof, K., Author
Vogl, G., Author
Fratzl, Peter¹, Author
Sielemann, R., Author
Keck, B., Author
Yoshida, Y., Author

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1External Organizations, ou_persistent22

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Dates: Date issued: 1993

Publication Status: Issued

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Identifiers: DOI: 10.1007/978-3-642-85049-3_5
PMID: 0040

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Title: Springer Series in Solid-State Sciences

Source Genre: Series

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Publ. Info: Berlin : Springer

Pages: - Volume / Issue: 117 Sequence Number: - Start / End Page: 44 - 47 Identifier: -

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Title: Electronic Properties of Fullerenes

Source Genre: Book

Creator(s):
Kuzmany, Hans, Editor
Fink, Jörg, Editor
Mehring, Michael, Author
Roth, Siegmar, Author

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-

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Pages: - Volume / Issue: - Sequence Number: - Start / End Page: - Identifier: ISBN: 978-3-642-85051-6