Organized under the auspices of the International Field Emission Society June 
10th–15th, 2018, Gaithersburg, Maryland, United States: Atom Probe Tomography 
and Microscopy, APT&M 2018

Menzel, Dietrich

doi:10.1017/S1431927619000370

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Organized under the auspices of the International Field Emission Society June 10th–15th, 2018, Gaithersburg, Maryland, United States: Atom Probe Tomography and Microscopy, APT&M 2018

Menzel, D. (2019). Organized under the auspices of the International Field Emission Society June 10th–15th, 2018, Gaithersburg, Maryland, United States: Atom Probe Tomography and Microscopy, APT&M 2018. Microscopy and Microanalysis, 25(Special Issue 2), 269-273. doi:10.1017/S1431927619000370.

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Item Permalink: https://hdl.handle.net/21.11116/0000-0003-BA8A-0 Version Permalink: https://hdl.handle.net/21.11116/0000-0004-7504-4

Genre: Journal Article

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Creators:
Menzel, Dietrich^{1, 2}, Author

Affiliations:
1Chemical Physics, Fritz Haber Institute, Max Planck Society, ou_24022
2Technische Universität München, ou_persistent22

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Language(s): eng - English

Dates: Published Online: 2019-04-25Date issued: 2019-04

Publication Status: Issued

Pages: 5

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Table of Contents: -

Rev. Type: Peer

Identifiers: DOI: 10.1017/S1431927619000370

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Title: Microscopy and Microanalysis

Abbreviation : Microsc. Microanal.

Source Genre: Journal

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Publ. Info: New York, NY : Cambridge University Press

Pages: 5 Volume / Issue: 25 (Special Issue 2) Sequence Number: - Start / End Page: 269 - 273 Identifier: ISSN: 1431-9276
CoNE: https://pure.mpg.de/cone/journals/resource/991042731793414