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  Importance of local pattern properties in spiral defect chaos

Egolf, D. A., Melnikov, I. V., & Bodenschatz, E. (1998). Importance of local pattern properties in spiral defect chaos. Physical Review Letters, 80(15): 3228. doi:10.1103/PhysRevLett.80.3228.

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Egolf, D. A., Author
Melnikov, I. V., Author
Bodenschatz, E.1, Author           
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1Laboratory for Fluid Dynamics, Pattern Formation and Biocomplexity, Max Planck Institute for Dynamics and Self-Organization, Max Planck Society, ou_2063287              

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 Abstract: analyze experimental data from Rayleigh-Bénard convection in a large aspect ratio cell using a new, efficient method applicable to disordered striped patterns from biological, chemical, optical, and fluid systems. We present statistics of various local pattern properties such as the local wave-vector magnitude, local pattern orientation, and defect densities. Using these statistics, we provide quantitative evidence demonstrating that the stability boundaries derived for infinite systems are applicable to local patches within disordered patterns. We also present the first experimental observation of multiple length scales within spiral defect chaos.

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Language(s): eng - English
 Dates: 1998-04
 Publication Status: Issued
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 Rev. Type: Peer
 Identifiers: DOI: 10.1103/PhysRevLett.80.3228
BibTex Citekey: Egolf.Melnikov.ea1998
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Title: Physical Review Letters
Source Genre: Journal
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Pages: 4 Volume / Issue: 80 (15) Sequence Number: 3228 Start / End Page: - Identifier: -