Nanoscale Imaging Using High Rep-Rate Lab-Based Soft X-Ray Sources

Zürch, Michael

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Nanoscale Imaging Using High Rep-Rate Lab-Based Soft X-Ray Sources

Zürch, M. (2019). Nanoscale Imaging Using High Rep-Rate Lab-Based Soft X-Ray Sources. Talk presented at SPIE Optics + Photonics 2019. San Diego, CA, USA. 2019-08.

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Item Permalink: https://hdl.handle.net/21.11116/0000-0004-65A0-5 Version Permalink: https://hdl.handle.net/21.11116/0000-0004-65A1-4

Genre: Talk

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Creators:
Zürch, Michael¹, Author

Affiliations:
1Physical Chemistry, Fritz Haber Institute, Max Planck Society, ou_634546

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Title: SPIE Optics + Photonics 2019

Place of Event: San Diego, CA, USA

Start-/End Date: 2019-08

Invited: Yes

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