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  Variable chemical decoration of extended defects in Cu-poor Cu2ZnSnSe4 thin films

Schwarz, T., Redinger, A., Siebentritt, S., Peng, Z., Gault, B., Raabe, D., et al. (2019). Variable chemical decoration of extended defects in Cu-poor Cu2ZnSnSe4 thin films. Physical Review Materials, 3: 035402. doi:10.1103/PhysRevMaterials.3.035402.

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 Creators:
Schwarz, Torsten1, Author           
Redinger, Alex2, Author           
Siebentritt, Susanne2, Author           
Peng, Zirong3, Author           
Gault, Baptiste1, Author           
Raabe, Dierk3, Author           
Choi, Pyuck-Pa4, Author           
Affiliations:
1Atom Probe Tomography, Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863384              
2University of Luxembourg, Laboratory for Photovoltaics, 41, rue du Brill, L-4422, Belvaux, Luxembourg, ou_persistent22              
3Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863381              
4Department of Materials Science and Engineering, Korea Advanced Institute of Science and Technology, Daejeon 34141, Korea, ou_persistent22              

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Language(s): eng - English
 Dates: 2019-03-19
 Publication Status: Issued
 Pages: -
 Publishing info: -
 Table of Contents: -
 Rev. Type: Peer
 Identifiers: DOI: 10.1103/PhysRevMaterials.3.035402
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Title: Physical Review Materials
  Abbreviation : Phys. Rev. Mater.
Source Genre: Journal
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Publ. Info: College Park, MD : American Physical Society
Pages: - Volume / Issue: 3 Sequence Number: 035402 Start / End Page: - Identifier: ISSN: 2475-9953
CoNE: https://pure.mpg.de/cone/journals/resource/2475-9953