Wimmer, C., Bonomo, F., Hurlbatt, A., Schiesko, L., Fantz, U., Heinemann, B., et al. (2019). Novel comparative measurement of H- beam divergences at the BATMAN Upgrade test facility: single beamlet and a group of beamlets. Poster presented at 18th International Conference on Ion Sources (ICIS 2019), Lanzhou.