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  Analyzing speckle contrast for HiLo microscopy optimization

Mazzaferri, J., Kunik, D., Belisle, J. M., Singh, K., Lefrancois, S., & Costantino, S. (2011). Analyzing speckle contrast for HiLo microscopy optimization. OPTICS EXPRESS, 19(15), 14508-14517. doi:10.1364/OE.19.014508.

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 Creators:
Mazzaferri, J.1, Author
Kunik, D.1, Author
Belisle, J. M.1, Author
Singh, Kanwarpal2, Author           
Lefrancois, S.1, Author
Costantino, S.1, Author
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1external, ou_persistent22              
2External Organizations, ou_persistent22              

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 Abstract: HiLo microscopy is a recently developed technique that provides both optical sectioning and fast imaging with a simple implementation and at a very low cost. The methodology combines widefield and speckled illumination images to obtain one optically sectioned image. Hence, the characteristics of such speckle illumination ultimately determine the quality of HiLo images and the overall performance of the method. In this work, we study how speckle contrast influence local variations of fluorescence intensity and brightness profiles of thick samples. We present this article as a guide to adjust the parameters of the system for optimizing the capabilities of this novel technology. (C) 2011 Optical Society of America

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Language(s): eng - English
 Dates: 2011-07-18
 Publication Status: Issued
 Pages: -
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 Table of Contents: -
 Rev. Type: -
 Identifiers: DOI: 10.1364/OE.19.014508
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Title: OPTICS EXPRESS
Source Genre: Journal
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Publ. Info: 2010 MASSACHUSETTS AVE NW, WASHINGTON, DC 20036 USA : OPTICAL SOC AMER
Pages: - Volume / Issue: 19 (15) Sequence Number: - Start / End Page: 14508 - 14517 Identifier: ISSN: 1094-4087