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  Improved serial sectioning workflow for multi-beam SEM applications – How to produce the ideal section for Volume EM

Tröger, C., Schulz, K., & Irsen, S. (2019). Improved serial sectioning workflow for multi-beam SEM applications – How to produce the ideal section for Volume EM. Poster presented at Microscopy Conference MC 2019, organized by DGE Deutsche Gesellschaft für Elektronenmikroskopie e. V. (German Society for Electron Microscopy), Berlin.

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Item Permalink: https://hdl.handle.net/21.11116/0000-0004-C3B9-F Version Permalink: https://hdl.handle.net/21.11116/0000-0006-440A-3
Genre: Poster

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2019_Tröger_EMA_Poster_ImprovedSerialSectioning_05-2019.pdf (Any fulltext), 33MB
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2019_Tröger_EMA_Poster_ImprovedSerialSectioning_05-2019.pdf
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https://www.microscopy-conference.de/ (Supplementary material)
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 Creators:
Tröger, Carola1, Author           
Schulz, Kathrin1, Author
Irsen, Stephan1, Author           
Affiliations:
1Electron Microscopy and Analytics, Center of Advanced European Studies and Research (caesar), Max Planck Society, ou_2173680              

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 Dates: 2019-09-05
 Publication Status: Issued
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Title: Microscopy Conference MC 2019, organized by DGE Deutsche Gesellschaft für Elektronenmikroskopie e. V. (German Society for Electron Microscopy)
Place of Event: Berlin
Start-/End Date: 2019-09-01 - 2019-09-05

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