English
 
User Manual Privacy Policy Disclaimer Contact us
  Advanced SearchBrowse

Item

ITEM ACTIONSEXPORT
  Quantitative trace element analysis with sub-micron lateral resolution

Reinert, T., Spemann, D., Morawski, M., & Arendt, T. (2006). Quantitative trace element analysis with sub-micron lateral resolution. Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 249(1-2), 734-737. doi:10.1016/j.nimb.2006.03.129.

Item is

Basic

show hide
Item Permalink: http://hdl.handle.net/21.11116/0000-0004-CEED-A Version Permalink: http://hdl.handle.net/21.11116/0000-0004-CEEE-9
Genre: Journal Article

Files

show Files

Locators

show

Creators

show
hide
 Creators:
Reinert, Tilo1, Author              
Spemann, Daniel1, Author
Morawski, Markus1, Author
Arendt, Thomas1, Author
Affiliations:
1External Organizations, ou_persistent22              

Content

show
hide
Free keywords: Trace element analysis; Sub-micron; PIXE
 Abstract: In recent years many nuclear microprobes have developed to sophisticated tools for elemental analysis with high resolutions down to about 1xa0;μm micron. The application to trace element analysis is mainly in the field of biological and medical research. Numerous successful studies on microscopic scale structures, e.g. cells, lead to the demand for higher spatial resolution or lower detection limits. Therefore, several labs started new efforts for sub-micron resolutions, sometimes intending 100xa0;nm. The Leipzig microprobe laboratory \LIPSION\ has recently improved its analytical capabilities. We are now able to perform quantitative trace element analysis with sub-micron spatial resolution (beam diameter 0.5xa0;μm at 120xa0;pA). As an example we give the trace element distribution in neuromelanin (intracellular pigment of neurons). Furthermore, when the scan size is reduced from cellular level, i.e. about 50xa0;μm, to sub-cellular level of about 10xa0;μm, the beam diameter can further be reduced by choosing smaller object diaphragms. The unavoidable reduction in beam current will not affect the mapping sensitivity unless the accumulated charge per spatial resolution is not decreased. The smallest beam diameter with analytical capabilities for elemental analysis we achieved thus far was about 300xa0;nm in diameter. It enables an outstanding microPIXE resolution. However, some difficulties appeared in high-resolution work, which limited the acquisition time to less than 30xa0;min.

Details

show
hide
Language(s): eng - English
 Dates: 2006-05-122006-08
 Publication Status: Published in print
 Pages: -
 Publishing info: -
 Table of Contents: -
 Rev. Method: Peer
 Identifiers: DOI: 10.1016/j.nimb.2006.03.129
BibTex Citekey: Reinert:2006
 Degree: -

Event

show

Legal Case

show

Project information

show

Source 1

show
hide
Title: Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
  Abbreviation : NIM B
Source Genre: Journal
 Creator(s):
Affiliations:
Publ. Info: Amsterdam : Elsevier B.V.
Pages: - Volume / Issue: 249 (1-2) Sequence Number: - Start / End Page: 734 - 737 Identifier: ISSN: 0168-583X
CoNE: https://pure.mpg.de/cone/journals/resource/954925484704