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Abstract:
This contribution deals with the morphological and elemental characterisation of biomedical samples with high energy (MeV) focused ion beams with special emphasis on high spatial resolution in the sub-micrometer regime and very low minimum detection limits (< 50 μM/l) in trace element analysis. This paper gives an overview of recent applications at the LIPSION laboratory using PIXE (Particle Induced X-ray Emission) and STIM (Scanning Ion Transmission Microscopy) as well as STIM-Tomography.