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  Parametric Model Order Reduction for Electro-Thermal Coupled Problems

Feng, L., & Benner, P. (2019). Parametric Model Order Reduction for Electro-Thermal Coupled Problems. In E. J. W. ter Maten, H.-G. Brachtendorf, R. Pulch, W. Schoenmaer, & H. De Gersem (Eds.), Nanoelectronic Coupled Problems Solutions (pp. 293-309). Cham, Switzerland: Springer.

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Item Permalink: http://hdl.handle.net/21.11116/0000-0004-ECD6-1 Version Permalink: http://hdl.handle.net/21.11116/0000-0005-3F2C-5
Genre: Book Chapter

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 Creators:
Feng, Lihong1, Author              
Benner, Peter1, Author              
Affiliations:
1Computational Methods in Systems and Control Theory, Max Planck Institute for Dynamics of Complex Technical Systems, Max Planck Society, ou_1738141              

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 Dates: 2019
 Publication Status: Published in print
 Pages: -
 Publishing info: -
 Table of Contents: -
 Rev. Method: -
 Identifiers: DOI: 10.1007/978-3-030-30726-4_13
 Degree: -

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Title: Nanoelectronic Coupled Problems Solutions
Source Genre: Book
 Creator(s):
ter Maten, E. J. W., Editor
Brachtendorf, H.-G., Editor
Pulch, R., Editor
Schoenmaer, W., Editor
De Gersem, H., Editor
Affiliations:
-
Publ. Info: Cham, Switzerland : Springer
Pages: - Volume / Issue: - Sequence Number: - Start / End Page: 293 - 309 Identifier: ISBN: 978-3-030-30726-4
DOI: 10.1007/978-3-030-30726-4
ISBN: 978-3-030-30725-7

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Title: The European Consortium for Mathematics in Industry
Source Genre: Series
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Publ. Info: Cham, Switzerland : Springer Nature
Pages: - Volume / Issue: 29 Sequence Number: - Start / End Page: - Identifier: -