Reduced Models and Uncertainty Quantification

Yue, Yao; Feng, Lihong; Benner, Peter; Pulch, Roland; Schöps, Sebastian

doi:10.1007/978-3-030-30726-4_15

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Reduced Models and Uncertainty Quantification

Yue, Y., Feng, L., Benner, P., Pulch, R., & Schöps, S. (2019). Reduced Models and Uncertainty Quantification. In E. J. W. ter Maten, H.-G. Brachtendorf, R. Pulch, W. Schoenmaker, & H. De Gersem (Eds.), Nanoelectronic Coupled Problems Solutions (pp. 329-346). Cham: Springer International Publishing.

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Item Permalink: https://hdl.handle.net/21.11116/0000-0004-ECD0-7 Version Permalink: https://hdl.handle.net/21.11116/0000-0009-D4A6-C

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Creators:
Yue, Yao¹, Author
Feng, Lihong¹, Author
Benner, Peter¹, Author
Pulch, Roland², Author
Schöps, Sebastian³, Author

Affiliations:
1Computational Methods in Systems and Control Theory, Max Planck Institute for Dynamics of Complex Technical Systems, Max Planck Society, ou_1738141
2Universität Greifswald, ou_persistent22
3TU Darmstadt, ou_persistent22

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Dates: Date issued: 2019

Publication Status: Issued

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Rev. Type: Peer

Identifiers: DOI: 10.1007/978-3-030-30726-4_15

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Title: Nanoelectronic Coupled Problems Solutions

Source Genre: Book

Creator(s):
ter Maten, E. J. W., Editor
Brachtendorf, H.-G., Editor
Pulch, R., Editor
Schoenmaker, W., Editor
De Gersem, H., Editor

Affiliations:
-

Publ. Info: Cham : Springer International Publishing

Pages: - Volume / Issue: - Sequence Number: - Start / End Page: 329 - 346 Identifier: ISBN: 978-3-030-30726-4
DOI: 10.1007/978-3-030-30726-4
ISBN: 978-3-030-30725-7

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Title: The European Consortium for Mathematics in Industry

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Publ. Info: Cham : Springer Nature

Pages: - Volume / Issue: 29 Sequence Number: - Start / End Page: - Identifier: -