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  Mechanistic Studies of Gas Reactions with Multicomponent Solids: What Can We Learn By Combining NAP XPS and Atomic Resolution STEM/EDX?

Sirotina, A. P., Callaert, C., Volykhov, A. A., Frolov, A. S., Sánchez-Barriga, J., Knop-Gericke, A., et al. (2019). Mechanistic Studies of Gas Reactions with Multicomponent Solids: What Can We Learn By Combining NAP XPS and Atomic Resolution STEM/EDX? The Journal of Physical Chemistry C, 123(43), 26201-26210. doi:10.1021/acs.jpcc.9b05052.

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 Creators:
Sirotina, Anna P.1, 2, Author
Callaert, Carolien3, Author
Volykhov, Andrey A.1, 4, Author
Frolov, Alexander S.1, Author
Sánchez-Barriga, Jaime5, Author
Knop-Gericke, Axel6, Author           
Hadermann, Joke3, Author
Yashina, Lada V.1, Author
Affiliations:
1Lomonosov Moscow State University, Leninskie Gory 1/3, 119991 Moscow, Russia, ou_persistent22              
2Institute of Nanotechnology of Microelectronics RAS, Nagatinskaya str., 16A/11, 115487 Moscow, Russia, ou_persistent22              
3EMAT, Department of Physics, University of Antwerp, Groenenborgerlaan 171, 2020 Antwerp, Belgium, ou_persistent22              
4Kurnakov Institute of General and Inorganic Chemistry RAS, Leninsky Avenue 31, 119991 Moscow, Russia, ou_persistent22              
5Helmholtz-Zentrum Berlin fuer Materialien und Energie, Elektronenspeicherring BESSY II, Albert-Einstein-Strasse 15, 12489 Berlin, Germany, ou_persistent22              
6Inorganic Chemistry, Fritz Haber Institute, Max Planck Society, ou_24023              

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 Abstract: Rapid development of experimental techniques has enabled real time studies of solid–gas reactions at the level reaching the atomic scale. In the present paper, we focus on a combination of atomic resolution STEM/EDX, which visualizes the reaction zone, and near ambient pressure (NAP) XPS, which collects information for a surface layer of variable thickness under reaction conditions. We compare the behavior of two affined topological insulators, Bi2Te3 and Sb2Te3. We used a simple reaction with molecular oxygen occurring at 298 K, which is of practical importance to avoid material degradation. Despite certain limitations, a combination of in situ XPS and ex situ cross-sectional STEM/EDX allowed us to obtain a self-consistent picture of the solid–gas reaction mechanism for oxidation of Sb2Te3 and Bi2Te3 crystals, which includes component redistribution between the oxide and the subsurface layer and Te segregation with formation of a thin ordered layer at the interface. The process is multistep in case of both compounds. At the very beginning of the oxidation process the reactivity is determined by the energy benefit of the corresponding element–oxygen bond formation. Further in the oxidation process, the behavior of these two compounds becomes similar and features component redistribution between the oxide and the subsurface layer.

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Language(s): eng - English
 Dates: 2019-09-182019-05-282019-10-022019-10-31
 Publication Status: Published in print
 Pages: 10
 Publishing info: -
 Table of Contents: -
 Rev. Type: Peer
 Identifiers: DOI: 10.1021/acs.jpcc.9b05052
 Degree: -

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Title: The Journal of Physical Chemistry C
  Abbreviation : J. Phys. Chem. C
Source Genre: Journal
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Publ. Info: Washington, D.C. : American Chemical Society
Pages: 10 Volume / Issue: 123 (43) Sequence Number: - Start / End Page: 26201 - 26210 Identifier: ISSN: 1932-7447
CoNE: https://pure.mpg.de/cone/journals/resource/954926947766