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  Detection of trace impurities and other defects in functional nanomaterials

Lim, J., Kim, S.-H., Sahu, R., Aymerich Armengol, R., Kasian, O., Choi, P.-P., et al. (2019). Detection of trace impurities and other defects in functional nanomaterials. Talk presented at International Workshop on Advanced and In-situ Microscopies of Functional Nanomaterials and Devices, IAMNano 2019. Düsseldorf, Germany. 2019-10-27 - 2019-10-30.

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Item Permalink: http://hdl.handle.net/21.11116/0000-0005-469D-C Version Permalink: http://hdl.handle.net/21.11116/0000-0005-46B2-3
Genre: Talk

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 Creators:
Lim, Joohyun1, Author              
Kim, Se-Ho2, Author              
Sahu, Rajib1, Author              
Aymerich Armengol, Raquel1, Author              
Kasian, Olga3, Author              
Choi, Pyuck-Pa4, Author              
Stephenson, Leigh2, Author              
Gault, Baptiste2, Author              
Scheu, Christina1, Author              
Affiliations:
1Nanoanalytics and Interfaces, Independent Max Planck Research Groups, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_2054294              
2Atom Probe Tomography, Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863384              
3Electrocatalysis, Interface Chemistry and Surface Engineering, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863354              
4Department of Materials Science and Engineering, Korea Advanced Institute of Science and Technology, Daejeon 34141, Korea, ou_persistent22              

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Language(s): eng - English
 Dates: 2019-10
 Publication Status: Not specified
 Pages: -
 Publishing info: -
 Table of Contents: -
 Rev. Type: -
 Identifiers: -
 Degree: -

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Title: International Workshop on Advanced and In-situ Microscopies of Functional Nanomaterials and Devices, IAMNano 2019
Place of Event: Düsseldorf, Germany
Start-/End Date: 2019-10-27 - 2019-10-30
Invited: Yes

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