Thermoelectric Materials : a methodology for defects – properties correlation

Abdellaoui, Lamya; Zhang, Siyuan; Rodenkirchen, Cynthia; Zaefferer, Stefan; Bueno Villoro, Ruben; Guen, E.; Chapuis, P.-O.; Gomès, S.; Cojocaru-Mirédin, Oana; Yu, Yuan; Amouyal, Yaron; Raabe, Dierk; Snyder, Gerald Jeffrey; Scheu, Christina

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Thermoelectric Materials : a methodology for defects – properties correlation

Abdellaoui, L., Zhang, S., Rodenkirchen, C., Zaefferer, S., Bueno Villoro, R., Guen, E., et al. (2019). Thermoelectric Materials: a methodology for defects – properties correlation. Poster presented at International Workshop on Advanced and In-situ Microscopies of Functional Nanomaterials and Devices, IAMNano, Düsseldorf, Germany.

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Item Permalink: https://hdl.handle.net/21.11116/0000-0005-6F66-D Version Permalink: https://hdl.handle.net/21.11116/0000-000D-16B7-C

Genre: Poster

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Creators:
Abdellaoui, Lamya¹, Author
Zhang, Siyuan¹, Author
Rodenkirchen, Cynthia², Author
Zaefferer, Stefan³, Author
Bueno Villoro, Ruben¹, Author
Guen, E.⁴, Author
Chapuis, P.-O.⁴, Author
Gomès, S.⁴, Author
Cojocaru-Mirédin, Oana², Author
Yu, Yuan⁵, Author
Amouyal, Yaron⁶, Author
Raabe, Dierk⁷, Author
Snyder, Gerald Jeffrey⁸, Author
Scheu, Christina¹, Author

Affiliations:
1Nanoanalytics and Interfaces, Independent Max Planck Research Groups, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_2054294
2I. Physikalisches Institut (IA), RWTH Aachen, 52074 Aachen, Germany, ou_persistent22
3Microscopy and Diffraction, Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863391
4CNRS, INSA-Lyon, Université Claude Bernard Lyon 1, CETHIL UMR5008, France, ou_persistent22
5RWTH Aachen University, I. Physikalisches Institut IA, 52056 Aachen, Germany, ou_persistent22
6Technion, Israel Institute of Technology, Haifa, Israel, ou_persistent22
7Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863381
8Northwestern University, Materials Science and Engineering Department, 2220 Campus Drive, Evanston, IL, 60208-3109, USA, ou_persistent22

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Language(s): eng - English

Dates: Created: 2019-10

Publication Status: Not specified

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Title: International Workshop on Advanced and In-situ Microscopies of Functional Nanomaterials and Devices, IAMNano

Place of Event: Düsseldorf, Germany

Start-/End Date: 2019-10-27 - 2019-10-30

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