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  Remote Tracking of Phase Changes in Cr2AlC Thin Films by In-situ Resistivity Measurements

Stelzer, B., Chen, X., Bliem, P., Hans, M., Völker, B., Sahu, R., et al. (2019). Remote Tracking of Phase Changes in Cr2AlC Thin Films by In-situ Resistivity Measurements. Scientific Reports, 9: 8266. doi:10.1038/s41598-019-44692-4.

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Item Permalink: http://hdl.handle.net/21.11116/0000-0005-738A-E Version Permalink: http://hdl.handle.net/21.11116/0000-0005-738B-D
Genre: Journal Article

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 Creators:
Stelzer, Bastian1, Author              
Chen, Xiang1, Author              
Bliem, Pascal1, Author              
Hans, Marcus2, Author              
Völker, Bernhard3, Author              
Sahu, Rajib4, Author              
Scheu, Christina4, Author              
Primetzhofer, Daniel5, Author              
Schneider, Jochen Michael6, Author              
Affiliations:
1Materials Chemistry, RWTH Aachen University, D-52074, Aachen, Germany, ou_persistent22              
2Materials Chemistry, RWTH Aachen University, Kopernikusstr. 10, Aachen, Germany, ou_persistent22              
3Structure and Nano-/ Micromechanics of Materials, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863398              
4Nanoanalytics and Interfaces, Independent Max Planck Research Groups, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_2054294              
5Department of Physics and Astronomy, Uppsala University, SE-75120 Uppsala, Sweden, ou_persistent22              
6Materials Chemistry, Lehrstuhl für Werkstoffchemie, RWTH Aachen, Germany, ou_persistent22              

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Language(s): eng - English
 Dates: 2019
 Publication Status: Published in print
 Pages: -
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 Rev. Type: -
 Identifiers: DOI: 10.1038/s41598-019-44692-4
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Title: Scientific Reports
  Abbreviation : Sci. Rep.
Source Genre: Journal
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Publ. Info: London, UK : Nature Publishing Group
Pages: 7 Volume / Issue: 9 Sequence Number: 8266 Start / End Page: - Identifier: ISSN: 2045-2322
CoNE: https://pure.mpg.de/cone/journals/resource/2045-2322