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  Suivi de l’endommagement par fatigue de micropiliers bicristallins par microdiffraction Laue 3D

Molin, J.-B., Renversade, L., Micha, J. S., Ulrich, O., Geaymond, O., Tardif, S., et al. (2019). Suivi de l’endommagement par fatigue de micropiliers bicristallins par microdiffraction Laue 3D. Talk presented at XIIIème Colloque Rayons X et Matière. Nancy, France. 2019-11-19 - 2019-11-22.

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Item Permalink: http://hdl.handle.net/21.11116/0000-0005-6EFA-7 Version Permalink: http://hdl.handle.net/21.11116/0000-0005-6EFB-6
Genre: Talk

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 Creators:
Molin, Jean-Baptiste1, Author              
Renversade, Loïc2, Author              
Micha, Jean Sébastien3, Author              
Ulrich, O.3, Author
Geaymond, O.4, Author              
Tardif, S.3, Author
Robach, Odile3, Author              
Kirchlechner, Christoph1, Author              
Affiliations:
1Nano-/ Micromechanics of Materials, Structure and Nano-/ Micromechanics of Materials, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863401              
2CRG-IF BM32 at ESRF, BP 220, 38043 Grenoble Cedex 9, France, ou_persistent22              
3ESRF, CRG IF BM32, Grenoble, France, ou_persistent22              
4InstitutNéel, CNRS 25 rue des Martyrs, F-38042 Grenoble, France, ou_persistent22              

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Language(s): fra - French
 Dates: 2019-11
 Publication Status: Not specified
 Pages: -
 Publishing info: -
 Table of Contents: -
 Rev. Type: -
 Identifiers: -
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Title: XIIIème Colloque Rayons X et Matière
Place of Event: Nancy, France
Start-/End Date: 2019-11-19 - 2019-11-22

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