English
 
Help Privacy Policy Disclaimer
  Advanced SearchBrowse

Item

ITEM ACTIONSEXPORT
  Suivi de l’endommagement par fatigue de micropiliers bicristallins par microdiffraction Laue 3D

Molin, J.-B., Renversade, L., Micha, J. S., Ulrich, O., Geaymond, O., Tardif, S., et al. (2019). Suivi de l’endommagement par fatigue de micropiliers bicristallins par microdiffraction Laue 3D. Talk presented at XIIIème Colloque Rayons X et Matière. Nancy, France. 2019-11-19 - 2019-11-22.

Item is

Files

show Files

Locators

show

Creators

show
hide
 Creators:
Molin, Jean-Baptiste1, Author           
Renversade, Loïc2, Author           
Micha, Jean Sébastien3, Author           
Ulrich, O.3, Author
Geaymond, O.4, Author           
Tardif, S.3, Author
Robach, Odile3, Author           
Kirchlechner, Christoph1, Author           
Affiliations:
1Nano-/ Micromechanics of Materials, Structure and Nano-/ Micromechanics of Materials, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863401              
2CRG-IF BM32 at ESRF, BP 220, 38043 Grenoble Cedex 9, France, ou_persistent22              
3ESRF, CRG IF BM32, Grenoble, France, ou_persistent22              
4InstitutNéel, CNRS 25 rue des Martyrs, F-38042 Grenoble, France, ou_persistent22              

Content

show

Details

show
hide
Language(s): fra - French
 Dates: 2019-11
 Publication Status: Not specified
 Pages: -
 Publishing info: -
 Table of Contents: -
 Rev. Type: -
 Identifiers: -
 Degree: -

Event

show
hide
Title: XIIIème Colloque Rayons X et Matière
Place of Event: Nancy, France
Start-/End Date: 2019-11-19 - 2019-11-22

Legal Case

show

Project information

show

Source

show