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  Thickness uniformity measurements and damage threshold tests of large-area GaAs/AlGaAs crystalline coatings for precision interferometry

Koch, P., Cole, G. D., Deutsch, C., Follman, D., Heu, P., Kinley-Hanlon, M., et al. (2019). Thickness uniformity measurements and damage threshold tests of large-area GaAs/AlGaAs crystalline coatings for precision interferometry. Optics Express, 27(25), 36731-36740. doi:10.1364/OE.27.036731.

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Item Permalink: http://hdl.handle.net/21.11116/0000-0005-7322-3 Version Permalink: http://hdl.handle.net/21.11116/0000-0005-7325-0
Genre: Journal Article

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oe-27-25-36731.pdf (Publisher version), 2MB
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oe-27-25-36731.pdf
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 Creators:
Koch, P.1, Author              
Cole, G. D., Author
Deutsch, C., Author
Follman, D., Author
Heu, P., Author
Kinley-Hanlon, M., Author
Kirchhoff, R.1, Author              
Leavey, S.1, Author              
Lehmann, J.1, Author              
Oppermann, P.1, Author              
Rai, A. K., Author
Tornasi, Z., Author
Woehler, J.1, Author              
Wu, D.1, Author              
Zederbauer, T., Author
Lück, H.1, Author              
Affiliations:
1Laser Interferometry & Gravitational Wave Astronomy, AEI-Hannover, MPI for Gravitational Physics, Max Planck Society, ou_24010              

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 Dates: 2019
 Publication Status: Published in print
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 Identifiers: DOI: 10.1364/OE.27.036731
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Title: Optics Express
Source Genre: Journal
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Pages: - Volume / Issue: 27 (25) Sequence Number: - Start / End Page: 36731 - 36740 Identifier: -