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  Beamlet scraping and its influence on the beam divergence at the BATMAN Upgrade test facility

Wimmer, C., Bonomo, F., Hurlbatt, A., Schiesko, L., Fantz, U., Harder, N. d., et al. (2020). Beamlet scraping and its influence on the beam divergence at the BATMAN Upgrade test facility. Review of Scientific Instruments, 91: 013509. doi:10.1063/1.5129336.

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https://doi.org/10.1063/1.5129336 (Publisher version)
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 Creators:
Wimmer, C.1, Author           
Bonomo, F.1, Author           
Hurlbatt, A.1, Author           
Schiesko, L.1, Author           
Fantz, U.1, Author           
Harder, N. den1, Author           
Heinemann, B.1, Author           
Mimo, A.1, Author           
Orozco, G.1, Author           
Agostini, M.2, Author
Barbisan, M.2, Author
Brombin, M.2, Author
Delogu, R.2, Author
Pimazzoni, A.2, Author
Poggi, C.2, Author
Serianni, G.2, Author
Ugoletti, M.2, Author
Veltri, P.2, Author
Affiliations:
1ITER Technology & Diagnostics (ITED), Max Planck Institute for Plasma Physics, Max Planck Society, ou_1856290              
2External Organizations, ou_persistent22              

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Free keywords: Konferenzbeitrag
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Language(s): eng - English
 Dates: 20192020
 Publication Status: Issued
 Pages: 5 p.
 Publishing info: -
 Table of Contents: -
 Rev. Type: Peer
 Identifiers: DOI: 10.1063/1.5129336
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Title: Review of Scientific Instruments
  Abbreviation : Rev. Sci. Instrum.
  Subtitle : 18th International Conference on Ion Sources (ICIS 2019), Lanzhou, 2019-09-01 to 2019-09-06
Source Genre: Journal
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Publ. Info: Melville, NY : AIP Publishing
Pages: - Volume / Issue: 91 Sequence Number: 013509 Start / End Page: - Identifier: ISSN: 0034-6748
CoNE: https://pure.mpg.de/cone/journals/resource/991042742033452