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  An ultra-flexible modular high vacuum setup for thin film deposition

Götsch, T., Wernig, E.-M., Klötzer, B., Schachinger, T., Kunze-Liebhaeuser, J., & Penner, S. (2019). An ultra-flexible modular high vacuum setup for thin film deposition. Review of Scientific Instruments, 90(2): 023902. doi:10.1063/1.5065786.

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 Creators:
Götsch, Thomas1, Author           
Wernig, Eva-Maria, Author
Klötzer, Bernhard, Author
Schachinger, Thomas, Author
Kunze-Liebhaeuser, Julia, Author
Penner, Simon, Author
Affiliations:
1Research Department Schlögl, Max Planck Institute for Chemical Energy Conversion, Max Planck Society, ou_3023874              

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 Abstract: A modular high vacuum chamber dedicated to thin film deposition is presented. We detail the vacuum and gas infrastructure required to operate two highly flexible chambers simultaneously, with a focus on evaporation techniques (thermal and electron beam) and magnetron sputtering, including baking equipment to remove residual water from the chamber. The use of O-ring-sealed flat flanges allows a tool-free assembly process, in turn enabling rapid changes of the whole setup. This leads to a high flexibility regarding the deposition techniques as the chamber can be adapted to different sources within minutes, permitting the formation of multilayer systems by consecutive depositions onto the same substrate. The central piece of the chamber is a flat flange ground glass tube or cross. The glass recipient permits optical monitoring of the deposition process. Further equipment, such as for the introduction of gases, additional pressure gauges, or evaporators, can be incorporated via specifically designed stainless steel/aluminum interconnectors and blank flanges. In the end, we demonstrate the preparation of an unsupported thin film system consisting of electron-beam-evaporated platinum nanoparticles embedded in magnetron-sputtered zirconia (ZrO2), deposited onto NaCl single crystals, which subsequently can be removed by dissolution. These films are further analyzed by means of transmission electron microscopy, X-ray photoelectron spectroscopy, and atomic force microscopy. Published under license by AIP Publishing.

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Language(s): eng - English
 Dates: 2019
 Publication Status: Published online
 Pages: -
 Publishing info: -
 Table of Contents: -
 Rev. Type: Peer
 Identifiers: ISI: 000460095300045
DOI: 10.1063/1.5065786
 Degree: -

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Title: Review of Scientific Instruments
  Abbreviation : Rev. Sci. Instrum.
Source Genre: Journal
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Publ. Info: Melville, NY : AIP Publishing
Pages: - Volume / Issue: 90 (2) Sequence Number: 023902 Start / End Page: - Identifier: ISSN: 0034-6748
CoNE: https://pure.mpg.de/cone/journals/resource/991042742033452