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  Improved stability of multi-reflection time-of-flight mass spectrometers through passive and active voltage stabilization

Wienholtz, F., Blaum, K., Karthein, J., Lunney, D., Malbrunot-Ettenauer, S., Manea, V., et al. (2020). Improved stability of multi-reflection time-of-flight mass spectrometers through passive and active voltage stabilization. Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 463, 348-356. doi:10.1016/j.nimb.2019.04.061.

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https://doi.org/10.1016/j.nimb.2019.04.061 (Publisher version)
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Wienholtz, F., Author
Blaum, K.1, Author           
Karthein, J., Author
Lunney, D., Author
Malbrunot-Ettenauer, S., Author
Manea, V., Author
Mougeot, M., Author
Schweikhard, L., Author
Steinsberger, Timo1, Author           
Wolf, R. N., Author
Affiliations:
1Division Prof. Dr. Klaus Blaum, MPI for Nuclear Physics, Max Planck Society, ou_904548              

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 MPINP: Speichertechnik - Abteilung Blaum
 Abstract: Multi-reflection time-of-flight (MR-ToF) spectrometers are devices in which ions are reflected between two electrostatic mirrors to prolong their flight path. The performance of the apparatus relies on the stability of the voltages that are used to define the mirror potentials. Especially the voltage of the mirror electrodes at the point where the ions reverse the direction of their axial motion needs to be stable in order to minimize fluctuations of their total flight time. Here we present a method to increase the short- and long-term stability of suitable voltage supplies for enhanced performance of the spectrometer.

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 Dates: 2020-01-14
 Publication Status: Issued
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 Rev. Type: -
 Identifiers: DOI: 10.1016/j.nimb.2019.04.061
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Title: Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
  Abbreviation : NIM B
Source Genre: Journal
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Publ. Info: Amsterdam : Elsevier B.V.
Pages: - Volume / Issue: 463 Sequence Number: - Start / End Page: 348 - 356 Identifier: ISSN: 0168-583X
CoNE: https://pure.mpg.de/cone/journals/resource/954925484704