X-ray microscopic characterization of high-Tc-supercoductors using image 
processing

Bihler, M.

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X-ray microscopic characterization of high-T_c-supercoductors using image processing

Bihler, M. (2019). X-ray microscopic characterization of high-T_c-supercoductors using image processing. Master Thesis, Universität Stuttgart, Stuttgart.

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Item Permalink: https://hdl.handle.net/21.11116/0000-0005-C6DE-2 Version Permalink: https://hdl.handle.net/21.11116/0000-0009-D604-1

Genre: Thesis

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Creators:
Bihler, M.^{1, 2}, Author

Affiliations:
1Dept. Modern Magnetic Systems, Max Planck Institute for Intelligent Systems, Max Planck Society, ou_1497648
23. Physikalisches Institut, Universität Stuttgart, Pfaffenwaldring 57, 70569 Stuttgart, ou_persistent22

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Free keywords: Abt. Schütz

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Language(s): eng - English

Dates: Accepted: 2019-11-22

Publication Status: Accepted / In Press

Pages: III, 83

Publishing info: Stuttgart : Universität Stuttgart

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Degree: Master

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