English
 
User Manual Privacy Policy Disclaimer Contact us
  Advanced SearchBrowse

Item

ITEM ACTIONSEXPORT
  Advances in automatic TEM based orientation mapping with precession electron diffraction

Jeong, J., Dehm, G., & Liebscher, C. (2019). Advances in automatic TEM based orientation mapping with precession electron diffraction. Poster presented at International Workshop on Advanced In Situ Microscopies of Functional Nanomaterials and Devices (IAMnano 2019), Düsseldorf, Germany.

Item is

Basic

show hide
Item Permalink: http://hdl.handle.net/21.11116/0000-0005-DEAD-F Version Permalink: http://hdl.handle.net/21.11116/0000-0005-DEAE-E
Genre: Poster

Files

show Files

Locators

show

Creators

show
hide
 Creators:
Jeong, Jiwon1, Author              
Dehm, Gerhard2, Author              
Liebscher, Christian1, Author              
Affiliations:
1Advanced Transmission Electron Microscopy, Structure and Nano-/ Micromechanics of Materials, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863399              
2Structure and Nano-/ Micromechanics of Materials, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863398              

Content

show

Details

show
hide
Language(s): eng - English
 Dates: 2019-10
 Publication Status: Not specified
 Pages: -
 Publishing info: -
 Table of Contents: -
 Rev. Type: -
 Identifiers: -
 Degree: -

Event

show
hide
Title: International Workshop on Advanced In Situ Microscopies of Functional Nanomaterials and Devices (IAMnano 2019)
Place of Event: Düsseldorf, Germany
Start-/End Date: 2019-10-27 - 2019-10-30

Legal Case

show

Project information

show

Source

show