Advances in automatic TEM based orientation mapping with precession electron 
diffraction

Jeong, Jiwon; Dehm, Gerhard; Liebscher, Christian

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Advances in automatic TEM based orientation mapping with precession electron diffraction

Jeong, J., Dehm, G., & Liebscher, C. (2019). Advances in automatic TEM based orientation mapping with precession electron diffraction. Talk presented at Joint Max-Planck-Institut für Eisenforschung MPIE) / Ernst Ruska-Centre (ER-C) Workshop. Düsseldorf, Germany. 2019-05-13 - 2019-05-13.

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Datensatz-Permalink: https://hdl.handle.net/21.11116/0000-0005-DEA3-9 Versions-Permalink: https://hdl.handle.net/21.11116/0000-0005-DEA4-8

Genre: Vortrag

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Urheber:
Jeong, Jiwon¹, Autor
Dehm, Gerhard², Autor
Liebscher, Christian¹, Autor

Affiliations:
1Advanced Transmission Electron Microscopy, Structure and Nano-/ Micromechanics of Materials, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863399
2Structure and Nano-/ Micromechanics of Materials, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863398