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  Advanced transmission electron microscopy of nanomaterials using In-situ TEM and precession electron diffraction

Jeong, J. (2019). Advanced transmission electron microscopy of nanomaterials using In-situ TEM and precession electron diffraction. Talk presented at Seminar, Korea Institute of Science and Technology (KIST). Seoul, South Korea. 2019-11-04.

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Item Permalink: https://hdl.handle.net/21.11116/0000-0005-DE67-E Version Permalink: https://hdl.handle.net/21.11116/0000-0009-543F-3
Genre: Talk

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 Creators:
Jeong, Jiwon1, Author           
Affiliations:
1Advanced Transmission Electron Microscopy, Structure and Nano-/ Micromechanics of Materials, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863399              

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Language(s): eng - English
 Dates: 2019-11-04
 Publication Status: Not specified
 Pages: -
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 Table of Contents: -
 Rev. Type: -
 Identifiers: -
 Degree: -

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Title: Seminar, Korea Institute of Science and Technology (KIST)
Place of Event: Seoul, South Korea
Start-/End Date: 2019-11-04
Invited: Yes

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