Advanced transmission electron microscopy of nanomaterials using In-situ TEM 
and precession electron diffraction

Jeong, Jiwon

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Advanced transmission electron microscopy of nanomaterials using In-situ TEM and precession electron diffraction

Jeong, J. (2019). Advanced transmission electron microscopy of nanomaterials using In-situ TEM and precession electron diffraction. Talk presented at Seminar, Korea Institute of Materials Science (KIMS). Seoul, South Korea. 2019-11-08.

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Datensatz-Permalink: https://hdl.handle.net/21.11116/0000-0005-DE6E-7 Versions-Permalink: https://hdl.handle.net/21.11116/0000-0009-543E-4

Genre: Vortrag

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Urheber:
Jeong, Jiwon¹, Autor

Affiliations:
1Advanced Transmission Electron Microscopy, Structure and Nano-/ Micromechanics of Materials, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863399