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  Advanced transmission electron microscopy of nanomaterials using In-situ TEM and precession electron diffraction

Jeong, J. (2019). Advanced transmission electron microscopy of nanomaterials using In-situ TEM and precession electron diffraction. Talk presented at Talk at Korea Institute of Industrial Technology (KITECH). Seoul, South Korea. 2019-11-13.

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Item Permalink: http://hdl.handle.net/21.11116/0000-0005-DE71-2 Version Permalink: http://hdl.handle.net/21.11116/0000-0005-DE72-1
Genre: Talk

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 Creators:
Jeong, Jiwon1, Author              
Affiliations:
1Advanced Transmission Electron Microscopy, Structure and Nano-/ Micromechanics of Materials, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863399              

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Language(s): eng - English
 Dates: 2019-11-13
 Publication Status: Not specified
 Pages: -
 Publishing info: -
 Table of Contents: -
 Rev. Method: -
 Identifiers: -
 Degree: -

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Title: Talk at Korea Institute of Industrial Technology (KITECH)
Place of Event: Seoul, South Korea
Start-/End Date: 2019-11-13
Invited: Yes

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