Advances in automatic TEM based orientation mapping with precession electron 
diffraction

Jeong, Jiwon; Dehm, Gerhard; Liebscher, Christian

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Advances in automatic TEM based orientation mapping with precession electron diffraction

Jeong, J., Dehm, G., & Liebscher, C. (2019). Advances in automatic TEM based orientation mapping with precession electron diffraction. Talk presented at KSM Annual Fall Conference 2019. Gyeongju, South Korea. 2019-11-14 - 2019-11-15.

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Item Permalink: https://hdl.handle.net/21.11116/0000-0005-DEA0-C Version Permalink: https://hdl.handle.net/21.11116/0000-0005-DEA1-B

Genre: Talk

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Creators:
Jeong, Jiwon¹, Author
Dehm, Gerhard², Author
Liebscher, Christian¹, Author

Affiliations:
1Advanced Transmission Electron Microscopy, Structure and Nano-/ Micromechanics of Materials, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863399
2Structure and Nano-/ Micromechanics of Materials, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863398

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Language(s): eng - English

Dates: Created: 2019-11

Publication Status: Not specified

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Title: KSM Annual Fall Conference 2019

Place of Event: Gyeongju, South Korea

Start-/End Date: 2019-11-14 - 2019-11-15

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