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  Automated structure discovery in atomic force microscopy

Alldritt, B., Hapala, P., Oinonen, N., Urtev, F., Krejci, O., Canova, F. F., et al. (2020). Automated structure discovery in atomic force microscopy. Science Advances, 6(9): eaay6913. doi:10.1126/sciadv.aay6913.

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Item Permalink: http://hdl.handle.net/21.11116/0000-0006-188E-0 Version Permalink: http://hdl.handle.net/21.11116/0000-0006-1942-4
Genre: Journal Article

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 Creators:
Alldritt, Benjamin1, Author
Hapala, Prokop1, Author
Oinonen, Niko1, Author
Urtev, Fedor1, 2, Author
Krejci, Ondrej1, Author
Canova, Filippo Federici1, 3, Author
Kannala, Juho2, Author
Schulz, Fabian1, 4, Author              
Liljeroth, Peter1, Author
Foster, Adam S.1, 5, 6, Author
Affiliations:
1Department of Applied Physics, Aalto University, 00076 Aalto, Espoo, Finland, ou_persistent22              
2Department of Computer Science, Aalto University, 00076 Aalto, Espoo, Finland, ou_persistent22              
3Nanolayers Research Computing Ltd., London, UK, ou_persistent22              
4Physical Chemistry, Fritz Haber Institute, Max Planck Society, ou_634546              
5Graduate School Materials Science in Mainz, Staudinger Weg 9, 55128, Germany, ou_persistent22              
6WPI Nano Life Science Institute (WPI-NanoLSI), Kanazawa University, Kakuma-machi, Kanazawa 920-1192, Japan, ou_persistent22              

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 Abstract: Atomic force microscopy (AFM) with molecule-functionalized tips has emerged as the primary experimental technique for probing the atomic structure of organic molecules on surfaces. Most experiments have been limited to nearly planar aromatic molecules due to difficulties with interpretation of highly distorted AFM images originating from nonplanar molecules. Here, we develop a deep learning infrastructure that matches a set of AFM images with a unique descriptor characterizing the molecular configuration, allowing us to predict the molecular structure directly. We apply this methodology to resolve several distinct adsorption configurations of 1S-camphor on Cu(111) based on low-temperature AFM measurements. This approach will open the door to applying high-resolution AFM to a large variety of systems, for which routine atomic and chemical structural resolution on the level of individual objects/molecules would be a major breakthrough.

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Language(s): eng - English
 Dates: 2019-07-122019-12-042020-02-26
 Publication Status: Published online
 Pages: 10
 Publishing info: -
 Table of Contents: -
 Rev. Type: Peer
 Identifiers: DOI: 10.1126/sciadv.aay6913
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Title: Science Advances
  Other : Sci. Adv.
Source Genre: Journal
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Publ. Info: Washington : AAAS
Pages: 10 Volume / Issue: 6 (9) Sequence Number: eaay6913 Start / End Page: - Identifier: ISSN: 2375-2548
CoNE: https://pure.mpg.de/cone/journals/resource/2375-2548