A UHV-compatible photoelectron emission microscope for applications in surface 
science

Engel, Wilfried; Kordesch, Martin E.; Rotermund, Harm-Hinrich; Kubala, Sven; Oertzen, Alexander von

doi:10.1016/0304-3991(91)90146-W

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A UHV-compatible photoelectron emission microscope for applications in surface science

Engel, W., Kordesch, M. E., Rotermund, H.-H., Kubala, S., & Oertzen, A. v. (1991). A UHV-compatible photoelectron emission microscope for applications in surface science. Ultramicroscopy, 36(1-3), 148-153. doi:10.1016/0304-3991(91)90146-W.

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Item Permalink: https://hdl.handle.net/21.11116/0000-0006-649F-7 Version Permalink: https://hdl.handle.net/21.11116/0000-0006-64A1-3

Genre: Journal Article

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Creators:
Engel, Wilfried¹, Author
Kordesch, Martin E.², Author
Rotermund, Harm-Hinrich³, Author
Kubala, Sven³, Author
Oertzen, Alexander von³, Author

Affiliations:
1Inorganic Chemistry, Fritz Haber Institute, Max Planck Society, ou_24023
2Fritz Haber Institute, Max Planck Society, ou_24021
3Physical Chemistry, Fritz Haber Institute, Max Planck Society, ou_634546

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Abstract: A three-stage electrostatic photoelectron emission microscope (PEEM) for use as an attachment on a UHV surface analysis chamber is described. The PEEM is intended for surface studies with lateral resolution of the order of 0 1 pm where the real-time observation of processes is important.

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Dates: Submitted: 1990-08-11Accepted: 1990-12-01Date issued: 1991-05

Publication Status: Issued

Pages: 6

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Rev. Type: Peer

Identifiers: DOI: 10.1016/0304-3991(91)90146-W

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Title: Ultramicroscopy

Abbreviation : Ultramicroscopy

Source Genre: Journal

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Publ. Info: Amsterdam : North-Holland

Pages: 6 Volume / Issue: 36 (1-3) Sequence Number: - Start / End Page: 148 - 153 Identifier: ISSN: 0304-3991
CoNE: https://pure.mpg.de/cone/journals/resource/954925512451