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  X-ray reflectivity measurements at chromium-iridium tri-layer coatings

Stehlikova, V., Döhring, T., Schäfer, T., Stollenwerk, M., Friedrich, P., Burwitz, V., et al. (2019). X-ray reflectivity measurements at chromium-iridium tri-layer coatings. In S. L. O'Dell, & G. Pareschi (Eds.), Optics for EUV, X-Ray, and Gamma-Ray Astronomy IX. doi:10.1117/12.2530439.

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Item Permalink: http://hdl.handle.net/21.11116/0000-0006-668C-A Version Permalink: http://hdl.handle.net/21.11116/0000-0006-668D-9
Genre: Conference Paper

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 Creators:
Stehlikova, Veronika1, Author              
Döhring, Thorsten, Author
Schäfer, Tobias, Author
Stollenwerk, Manfred, Author
Friedrich, Peter1, Author              
Burwitz, Vadim, Author
Hartner, Gisela, Author
Bradshaw, Miranda, Author
Liao, Yingyu, Author
Pelliciari, Carlo, Author
Affiliations:
1High Energy Astrophysics, MPI for Extraterrestrial Physics, Max Planck Society, ou_159890              

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 Abstract: Studying astronomical objects in the X-ray regime, iridium-based layer systems are highly effective reflective materials for telescopes mirrors. Aschaffenburg University and the Czech Technical University in Prague jointly developed stress compensated chromium-iridium coatings. To overcome the disturbing reflectivity reduction of the iridium absorption edge around 2 keV photon energy and improve general reflectivity at lower incident energies, thin overcoat layers of chromium have been applied in addition. Corresponding measurements at several X-ray lines have been performed on these samples at the PANTER test facility of the Max-Planck Institute for extraterrestrial Physics. A part of the experimental results and their comparison with theoretical simulations are presented in this contribution.

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 Dates: 2019-09-09
 Publication Status: Published online
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 Identifiers: DOI: 10.1117/12.2530439
Other: LOCALID: 3230990
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Title: SPIE OPTICAL ENGINEERING + APPLICATIONS
Place of Event: San Diego, CA
Start-/End Date: 2019-08-11 - 2019-08-15

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Title: Optics for EUV, X-Ray, and Gamma-Ray Astronomy IX
Source Genre: Proceedings
 Creator(s):
O'Dell, Stephen L., Editor
Pareschi, Giovanni , Editor
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Pages: - Volume / Issue: 11119 Sequence Number: 111191L Start / End Page: - Identifier: -

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Title: Proceedings of SPIE
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Publ. Info: SPIE-INT SOC OPTICAL ENGINEERING
Pages: - Volume / Issue: - Sequence Number: - Start / End Page: - Identifier: ISSN: 0277-786X