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  A Novel Shadowgraphic Inline Measurement Technique for Image-Based Crystal Size Distribution Analysis

Wirz, D., Hofmann, M., Lorenz, H., Bart, H.-J., Seidel-Morgenstern, A., Temmel, E., et al. (2020). A Novel Shadowgraphic Inline Measurement Technique for Image-Based Crystal Size Distribution Analysis. Crystals, 10(9): 740. doi:10.3390/cryst10090740.

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Item Permalink: http://hdl.handle.net/21.11116/0000-0006-F775-0 Version Permalink: http://hdl.handle.net/21.11116/0000-0006-F778-D
Genre: Journal Article

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temmel_3251324.pdf (Publisher version), 9MB
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This is an open access article distributed under the Creative Commons Attribution License which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited

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 Creators:
Wirz, Dominic1, Author
Hofmann, Marc1, Author
Lorenz, Heike2, Author              
Bart, Hans-Jörg1, Author
Seidel-Morgenstern, Andreas2, 3, Author              
Temmel, Erik2, Author              
Temmel, Erik2, 4, Author
Affiliations:
1Chair of Separation Science and Technology, TU Kaiserslautern, Gottlieb-Daimler-Straße, 67663 Kaiserslautern, Germany;, ou_persistent22              
2Physical and Chemical Foundations of Process Engineering, Max Planck Institute for Dynamics of Complex Technical Systems, Max Planck Society, ou_1738150              
3Otto-von-Guericke-Universität Magdeburg, External Organizations, ou_1738156              
4Sulzer Chemtech Ltd., Gewerbestraße 28, 4123 Allschwil, Switzerland, ou_persistent22              

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Language(s): eng - English
 Dates: 2020
 Publication Status: Published in print
 Pages: -
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 Table of Contents: -
 Rev. Type: Peer
 Identifiers: DOI: 10.3390/cryst10090740
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Title: Crystals
Source Genre: Journal
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Pages: - Volume / Issue: 10 (9) Sequence Number: 740 Start / End Page: - Identifier: ISSN: 2073-4352