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  Optical coherence tomography with a nonlinear interferometer in the high parametric gain regime

Machado, G. J., Frascella, G., Torres, J. P., & Chekhova, M. V. (in press). Optical coherence tomography with a nonlinear interferometer in the high parametric gain regime. Applied Physics Letters. doi:10.1063/5.0016259.

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Item Permalink: http://hdl.handle.net/21.11116/0000-0006-FB90-C Version Permalink: http://hdl.handle.net/21.11116/0000-0006-FB91-B
Genre: Journal Article

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 Creators:
Machado, Gerard J.1, Author
Frascella, Gaetano2, 3, 4, Author              
Torres, Juan P.1, 5, Author
Chekhova, Maria V.3, 4, Author              
Affiliations:
1CFO-Institut de Ciencies Fotoniques, The Barcelona Institute of Science and Technology, ou_persistent22              
2International Max Planck Research School, Max Planck Institute for the Science of Light, Max Planck Society, ou_2364697              
3Chekhova Research Group, Research Groups, Max Planck Institute for the Science of Light, Max Planck Society, ou_2364715              
4University of Erlangen-Nuremberg, ou_persistent22              
5Department of Signal Theory and Communications, Universitat Politecnica de Catalunya, ou_persistent22              

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 Abstract: We demonstrate optical coherence tomography based on an SU(1,1) nonlinear interferometer with high-gain parametric downconversion. For imaging and sensing applications, this scheme promises to outperform previous experiments working at low parametric gain, since higher photon fluxes provide lower integration times for obtaining high-quality images. In this way, one can avoid using single-photon detectors or CCD cameras with very high sensitivities, and standard spectrometers can be used instead. Other advantages are higher sensitivity to small loss and amplification before detection so that the detected light power considerably exceeds the probing one.

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Language(s): eng - English
 Dates: 2020-08-17
 Publication Status: Accepted / In Press
 Pages: -
 Publishing info: -
 Table of Contents: -
 Rev. Type: -
 Identifiers: DOI: 10.1063/5.0016259
 Degree: -

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Title: Applied Physics Letters
  Abbreviation : Appl. Phys. Lett.
Source Genre: Journal
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Publ. Info: Melville, NY : American Institute of Physics
Pages: - Volume / Issue: - Sequence Number: - Start / End Page: - Identifier: ISSN: 0003-6951
CoNE: https://pure.mpg.de/cone/journals/resource/954922836223