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Zusammenfassung:
Near-edge X-ray absorption spectroscopy (NEXAFS) has been used to study the orientation of tetracene on clean Si(111)-(7 × 7) and on oxidized Si(111). From an analysis of the polarization of the resonances we conclude that thin layers of tetracene (∼ 1 monolayer) are adsorbed on Si(111) with the molecular plane essentially parallel to the surface. On the oxidized Si(111) surface, tetracene is adsorbed at low coverages (∼ 1–2 monolayers) with the molecular plane perpendicular to the surface.
