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  Strong-field-induced single and double ionization dynamics from single and double excitations in a two-electron atom

Borisova, G. D., Stooß, V., Dingeldey, A., Kaldun, A., Ding, T., Birk, P., et al. (2020). Strong-field-induced single and double ionization dynamics from single and double excitations in a two-electron atom. Journal of physics communications, 4: 055012. doi:10.1088/2399-6528/ab6175.

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Borisova, Gergana Dimitrova1, Autor           
Stooß, Veit1, Autor           
Dingeldey , Andreas, Autor
Kaldun, Andreas1, Autor           
Ding, Thomas1, Autor           
Birk, Paul1, Autor           
Hartmann, Maximilian1, Autor           
Heldt, Tobias1, Autor           
Ott, Christian1, Autor           
Pfeifer, Thomas1, Autor           
Affiliations:
1Division Prof. Dr. Thomas Pfeifer, MPI for Nuclear Physics, Max Planck Society, ou_2025284              

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 Zusammenfassung: Two-electron dynamics of an excited model atom interacting with moderately strong laser fields is analyzed in the time domain. We solve the time-dependent Schrödinger equation (TDSE) for two electrons confined to the same one-dimensional configuration space, accounting also for the electron-electron interaction. The computational method allows direct access to the time-dependent population of the relevant atomic states during and right after the interaction with a near-infrared (NIR) laser pulse. We compare the ionization dynamics of singly excited states and doubly excited states. We find that doubly-excited initial states exhibit enhanced double ionization yield, with non-trivial dynamics including contributions from direct and sequential processes, while the electrons leave the atom either back-to-back or in the same direction.

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 Datum: 2020-05-26
 Publikationsstatus: Online veröffentlicht
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 Identifikatoren: DOI: 10.1088/2399-6528/ab6175
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Titel: Journal of physics communications
Genre der Quelle: Zeitschrift
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Ort, Verlag, Ausgabe: Bristol, UK : IOP Publishing
Seiten: - Band / Heft: 4 Artikelnummer: 055012 Start- / Endseite: - Identifikator: ISSN: 2399-6528
CoNE: https://pure.mpg.de/cone/journals/resource/2399-6528