Component-based quantification of EELS spectrum imaging

Zhang, Siyuan; Scheu, Christina

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Component-based quantification of EELS spectrum imaging

Zhang, S., & Scheu, C. (2019). Component-based quantification of EELS spectrum imaging. Poster presented at IAMNano 2019, Düsseldorf, Germany.

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Item Permalink: https://hdl.handle.net/21.11116/0000-0007-1D6E-F Version Permalink: https://hdl.handle.net/21.11116/0000-0007-1D6F-E

Genre: Poster

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Creators:
Zhang, Siyuan¹, Author
Scheu, Christina¹, Author

Affiliations:
1Nanoanalytics and Interfaces, Independent Max Planck Research Groups, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_2054294

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Language(s): eng - English

Dates: Created: 2019-10-27

Publication Status: Not specified

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Title: IAMNano 2019

Place of Event: Düsseldorf, Germany

Start-/End Date: 2019-10-27 - 2019-10-30

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