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  Large-format X-ray reflection grating operated in an echelle-like mounting

DeRoo, C. T., McEntaffer, R. L., Donovan, B. D., Grisé, F., Eichfeld, C., Burwitz, V., et al. (2020). Large-format X-ray reflection grating operated in an echelle-like mounting. The Astrophysical Journal, 897(1): 92. doi:10.3847/1538-4357/ab9a41.

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Item Permalink: http://hdl.handle.net/21.11116/0000-0007-1FA8-A Version Permalink: http://hdl.handle.net/21.11116/0000-0007-1FA9-9
Genre: Journal Article

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 Creators:
DeRoo, Casey T., Author
McEntaffer, Randall L., Author
Donovan, Benjamin D., Author
Grisé, Fabien, Author
Eichfeld, Chad, Author
Burwitz, Vadim1, Author              
Hartner, Gisela1, Author              
Pelliciari, Carlo1, Author              
La Caria, Marlis-Madeleine1, Author              
Affiliations:
1High Energy Astrophysics, MPI for Extraterrestrial Physics, Max Planck Society, ou_159890              

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 Abstract: We report on resolving power measurements of an X-ray reflection grating designed for use in an astronomical soft X-ray spectrograph. The grating was patterned via electron-beam lithography (EBL) to have fanned grooves to match the convergence of an illuminating beam. Grating measurements were conducted in an echelle-like mounting, which yields access to high diffraction orders in the soft X-ray bandpass (0.2–2.0 keV). By comparing the zeroth-order line-spread function to the telescope focus, we find evidence for minimal broadening (<1'') introduced by the figure of the grating. In addition, we fit for the spectral resolution (R = λ/Δλ) intrinsic to this grating using a Bayesian Markov Chain Monte Carlo approach. Using an ensemble fitting technique, we find that the grating resolution R exceeds 2200 (3σ lower bound). This current grating resolution meets the performance required for a notional soft X-ray grating spectroscopy mission measuring hot baryonic material in the extended halos of galaxies. Using ray-trace simulations, we identify a geometric aberration resulting from path length differences across the width of the grating as a limiting factor in assessing the resolution of these gratings and discuss methods for placing better constraints on the inherent resolution of X-ray astronomical reflection gratings fabricated using EBL.

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 Dates: 2020-07-07
 Publication Status: Published online
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 Identifiers: DOI: 10.3847/1538-4357/ab9a41
Other: LOCALID: 3256729
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Title: The Astrophysical Journal
Source Genre: Journal
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Publ. Info: Bristol; Vienna : IOP Publishing; IAEA
Pages: - Volume / Issue: 897 (1) Sequence Number: 92 Start / End Page: - Identifier: ISSN: 0004-637X
CoNE: https://pure.mpg.de/cone/journals/resource/954922828215_3