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  TEM study of tantalum clusters on Al2O3/NiAl(110)

Nepijko, S. A., Klimenkov, M., Kuhlenbeck, H., Zemlyanov, D., Herein, D., Schlögl, R., et al. (1998). TEM study of tantalum clusters on Al2O3/NiAl(110). Surface Science, 412-413, 192-201. doi:10.1016/S0039-6028(98)00387-2.

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Nepijko, Sergej A.1, Autor           
Klimenkov, Michail2, Autor           
Kuhlenbeck, Helmut2, Autor           
Zemlyanov, Dimitry3, Autor           
Herein, Daniel3, Autor           
Schlögl, Robert3, Autor           
Freund, Hans-Joachim2, Autor           
Affiliations:
1Physical Chemistry, Fritz Haber Institute, Max Planck Society, ou_634546              
2Chemical Physics, Fritz Haber Institute, Max Planck Society, ou_24022              
3Inorganic Chemistry, Fritz Haber Institute, Max Planck Society, ou_24023              

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 Zusammenfassung: Employing transmission electron microscopy (TEM), energy dispersive X-ray analysis (EDX) and X-ray photoelectron spectroscopy (XPS) we have studied tantalum clusters on a thin Al2O3 film epitaxially grown on NiAl(110). Our data reveal that the clusters are three dimensional, growing epitaxially on the oxide film with their [110] directions parallel to the surface normal and Ta[001]‖NiAl[001]. From the observed moiré fringes the tantalum lattice constant could be determined as a function of the cluster size. We found that the lattice constant decreases with decreasing cluster size with the highest observed reduction being 4.5% for a cluster with a diameter of 12.5 Å. Interestingly the clusters are only partly oxidized as concluded from XPS, TEM and EDX data although the samples were exposed to air after cluster deposition.

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Sprache(n): eng - English
 Datum: 1998-03-231998-05-191998-09-03
 Publikationsstatus: Erschienen
 Seiten: 10
 Ort, Verlag, Ausgabe: -
 Inhaltsverzeichnis: -
 Art der Begutachtung: Expertenbegutachtung
 Identifikatoren: DOI: 10.1016/S0039-6028(98)00387-2
 Art des Abschluß: -

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Titel: Surface Science
  Kurztitel : Surf. Sci.
Genre der Quelle: Zeitschrift
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Ort, Verlag, Ausgabe: Amsterdam : Elsevier
Seiten: 10 Band / Heft: 412-413 Artikelnummer: - Start- / Endseite: 192 - 201 Identifikator: ISSN: 0039-6028
CoNE: https://pure.mpg.de/cone/journals/resource/0039-6028