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  SMART: An Aberration-Corrected XPEEM/LEEM with Energy Filter

Wichtendahl, R., Fink, R., Kuhlenbeck, H., Preikszas, D., Rose, H., Spehr, R., et al. (1998). SMART: An Aberration-Corrected XPEEM/LEEM with Energy Filter. Surface Review and Letters, 5(6), 1249-1256. doi:10.1142/S0218625X98001584.

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 Creators:
Wichtendahl, Ralph1, Author              
Fink, R.2, Author
Kuhlenbeck, Helmut3, Author              
Preikszas, D.4, Author
Rose, H.4, Author
Spehr, R.4, Author
Hartel, P.4, Author
Engel, Wilfried5, Author              
Schlögl, Robert5, Author              
Freund, Hans-Joachim3, Author              
Bradshaw, Alexander M.1, Author              
Lilienkamp, G.6, Author
Schmidt, Th.6, Author
Bauer, E.6, Author
Benner, G.7, Author
Umbach, E.2, Author
Affiliations:
1Fritz Haber Institute, Max Planck Society, ou_24021              
2Universität Würzburg, Experimentelle Physik II, Germany, ou_persistent22              
3Chemical Physics, Fritz Haber Institute, Max Planck Society, ou_24022              
4Technische Hochschule Darmstadt, Angewandte Physik, Germany, ou_persistent22              
5Inorganic Chemistry, Fritz Haber Institute, Max Planck Society, ou_24023              
6Arizona State University, Department of Physics and Astronomy, Tempe, USA, ou_persistent22              
7LEO Elektronenmikroskopie GmbH, Oberkochen, Germany, ou_persistent22              

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 Abstract: A new UHV spectroscopic X-ray photoelectron emission and low energy electron microscope is presently under construction for the installation at the PM-6 soft X-ray undulator beamline at BESSY II. Using a combination of a sophisticated magnetic beam splitter and an electrostatic tetrode mirror, the spherical and chromatic aberrations of the objective lens are corrected and thus the lateral resolution and sensitivity of the instrument improved. In addition a corrected imaging energy filter (a so-called omega filter) allows high spectral resolution (ΔE=0.1 eV) in the photoemission modes and back-ground suppression in LEEM and small-spot LEED modes. The theoretical prediction for the lateral resolution is 5 Å; a realistic goal is about 2 nm. Thus, a variety of electron spectroscopies (XAS, XPS, UPS, XAES) and electron diffraction (LEED, LEEM) or reflection techniques (MEM) will be available with spatial resolution unreached so far.

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Language(s): eng - English
 Dates: 1998-09-011998
 Publication Status: Published in print
 Pages: 8
 Publishing info: -
 Table of Contents: -
 Rev. Type: Peer
 Identifiers: DOI: 10.1142/S0218625X98001584
 Degree: -

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Title: Surface Review and Letters
  Other : Surf. Rev. Lett.
Source Genre: Journal
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Publ. Info: Singapore : World Scientific
Pages: - Volume / Issue: 5 (6) Sequence Number: - Start / End Page: 1249 - 1256 Identifier: ISSN: 0218-625X
CoNE: https://pure.mpg.de/cone/journals/resource/954925493953