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要旨:
In this thesis highly charged iron as well as argon ions were investigated using
the electron beam ion trap FLASH-EBIT an the Max-Planck-Institut for Nuclear
Physics in Heidelberg. Using a flat-field grazing incidenc spectrometer flourencent
light from excited iron ions in a wavelength range from 25 to 40nm was recorded,
whereat emission lines of iron ions in the charge states X to XVI could be identified.
For diverse observed Fe XIV- and Fe XVI- emission electron-density-sensitive
lines intensity ratios were considered and compared with theoretical predictions.
Spectroscopy of highly charged argon ions took place for a wavelength range from
25 to 35nm, whereat emission lines from Ar X to Ar XVI were detected.
